A deterministic dynamic element matching approach to ADC testing
نویسندگان
چکیده
A deterministic dynamic element matching (DEM) approach to ADC testing is introduced and compared with a common random DEM method. With both approaches, a highly non-ideal DAC is used to generate an excitation for a DUT that has linearity that far exceeds that of the test stimulus. Simulation results show that both methods can be used for testing of ADCs but with a substantial reduction in the number of samples required for the deterministic DEM method. This technique of using an imprecise excitation to test an accurate ADC offers potential for use in both production test and BIST environments.
منابع مشابه
A Dynamic Element Matching Approach to Adc Testing
A dynamic element matching approach to ADC testing is presented. With this technique a highly nonideal DAC is used to generate an excitation for the DUT. Dynamic element matching is used to create a statically precise excitation from imprecise components. Simulation results show this approach can be used to accurately measure the performance of an ADC. This technique offers potential for use in...
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